Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC
Email/Printer Friendly Format  
 

SNR Walls for Signal Detection
Tandra, R.   Sahai, A.  
Univ. of California, Berkeley;

This paper appears in: Selected Topics in Signal Processing, IEEE Journal of
Publication Date: Feb. 2008
Volume: 2,  Issue: 1
On page(s): 4-17
ISSN: 1932-4553
INSPEC Accession Number: 9783946
Digital Object Identifier: 10.1109/JSTSP.2007.914879
Current Version Published: 2008-02-15

Abstract
This paper considers the detection of the presence/absence of signals in uncertain low SNR environments. Small modeling uncertainties are unavoidable in any practical system and so robustness to them is a fundamental performance metric. The impact of these modeling uncertainties can be quantified by the position of the "SNR wall" below which a detector will fail to be robust, no matter how long it can observe the channel. We propose simple mathematical models for the uncertainty in the noise and fading processes. These are used to show what aspects of the model lead to SNR walls for differing levels of knowledge of the signal to be detected. These results have implications for wireless spectrum regulators. The context is opportunistically sharing spectrum with primary users that must be detected in order to avoid causing harmful interference on a channel. Ideally, a secondary system would be able to detect primaries robustly without having to know much about their signaling strategies. We argue that the tension between primary and secondary users is captured by the technical question of computing the optimal tradeoff between the primary user's capacity and the secondary user's sensing robustness as quantified by the SNR wall. This is an open problem, but we compute this tradeoff for some simple detectors.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (1122 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved