Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Abstract
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right
Email/Printer Friendly Format  
 

Ethical issues in empirical studies of software engineering
Singer, J.   Vinson, N.G.  
Inst. for Inf. Technol., Nat. Res. Council of Canada, Ottawa, Ont.;

This paper appears in: Software Engineering, IEEE Transactions on
Publication Date: Dec 2002
Volume: 28,  Issue: 12
On page(s): 1171- 1180
ISSN: 0098-5589
INSPEC Accession Number: 7486540
Digital Object Identifier: 10.1109/TSE.2002.1158289
Current Version Published: 2003-01-06

Abstract
The popularity of empirical methods in software engineering research is on the rise. Surveys, experiments, metrics, case studies, and field studies are examples of empirical methods used to investigate both software engineering processes and products. The increased application of empirical methods has also brought about an increase in discussions about adapting these methods to the peculiarities of software engineering. In contrast, the ethical issues raised by empirical methods have received little, if any, attention in the software engineering literature. This article is intended to introduce the ethical issues raised by empirical research to the software engineering research community and to stimulate discussion of how best to deal with these ethical issues. Through a review of the ethical codes of several fields that commonly employ humans and artifacts as research subjects, we have identified major ethical issues relevant to empirical studies of software engineering. These issues are illustrated with real empirical studies of software engineering.

Index Terms
Available to subscribers and IEEE members.

References
Available to subscribers and IEEE members.
Citing Documents
Available to subscribers and IEEE members.
You are not logged in.
Guests may access Abstract records free of charge.
Login
Username
Password
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
Full Text: PDF (270 KB)
» Buy this document now
»  Learn more about
»  Learn more about
    purchasing articles
    and standards

Rights and Permissions
» Learn More
Download this citation
Available to subscribers and IEEE members.
 
arrow_leftView TOC   |arrow_leftPrevious Article   |  Next Articlearrow_right   |  Back to toparrow_up
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved