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		<title><![CDATA[ Solid-State Circuits, IEEE Journal of - new TOC ]]></title>
		<link>http://ieeexplore.ieee.org</link>
		<description>TOC Alert for Publication# 4 </description>
		<year>2010</year>
		<month>March    </month>
		<day>04</day>
		<item>
			<title><![CDATA[Table of contents]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419170]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419170]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>C1</startPage>
			<endPage>C1</endPage>
			<fileSize>38</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Journal of Solid-State Circuits publication information]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419175]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419175]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>C2</startPage>
			<endPage>C2</endPage>
			<fileSize>39</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Table of contents]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419174]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419174]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>501</startPage>
			<endPage>501</endPage>
			<fileSize>38</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[A Compact Wideband CMOS Low Noise Amplifier With Gain Flatness Enhancement]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419179]]></link>
			<description><![CDATA[<para> This paper presents a compact 0.18-<formula formulatype="inline"><tex Notation="TeX">$mu$</tex></formula>m CMOS wideband gain-flattened low noise amplifier (LNA). The low noise characteristic of the LNA is achieved by the noise canceling technique and the gain flatness is enhanced by the gate-inductive gain-peaking technique. In addition to extending flat-gain bandwidth, the proposed gain-peaking technique results in better wideband noise canceling and quick gain roll-off outside the desired signal band to reject interference. Without using any passive inductor, the core size of the fully-integrated CMOS LNA circuit is only 145 <formula formulatype="inline"><tex Notation="TeX">$mu$</tex> </formula>m<formula formulatype="inline"><tex Notation="TeX">$,times,$</tex> </formula>247 <formula formulatype="inline"><tex Notation="TeX">$mu$</tex> </formula>m. The measured gain and noise figure of the CMOS LNA are 16.4 dB and 2.1 dB, respectively. The gain variation of the LNA is <formula formulatype="inline"> <tex Notation="TeX">${pm} $</tex></formula>0.4 dB from 50 to 900 MHz. Operated at 1.8 V, the chip consumes 14.4 mW of power. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419179]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>502</startPage>
			<endPage>509</endPage>
			<fileSize>665</fileSize>
			<authors><![CDATA[Yu, Y.-H.;Yang, Y.-S.;Chen, Y.-J. E.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A Current Reuse Quadrature GPS Receiver in 0.13 <formula formulatype="inline"> <img src="/images/tex/241.gif" alt="\mu"> </formula>m CMOS]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419194]]></link>
			<description><![CDATA[<para> A fully-integrated quadrature low-IF L1-band GPS receiver consumes only 6.4 mW in 0.13 <formula formulatype="inline"><tex Notation="TeX">$mu$</tex> </formula>m CMOS. The RF front-end features a gate-modulated quadrature VCO for low phase noise and accurate quadrature phase signal generation. It merges the LNA, quadrature mixer, and quadrature VCO in a single current-reuse stacked topology that provides a conversion gain 42.5 dB with a power consumption of 1 mW. A continuous-time (CT) quadrature bandpass sigma-delta analog-to-digital converter (ADC) provides inherent anti-alias filtering, which simplifies the overall system. The second-order CT <formula formulatype="inline"><tex Notation="TeX">$Sigma Delta$</tex></formula> ADC achieves 65 dB dynamic range and dissipates only 4.2 mW using resistor DAC feedback. The receiver exhibits an NF of 6.5 dB and an IIP3 of <formula formulatype="inline"><tex Notation="TeX">${-}$</tex> </formula>30 dBm; the PLL phase noise is <formula formulatype="inline"><tex Notation="TeX">${-}$</tex></formula>110 dBc/Hz @<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>1<formula formulatype="inline"> <tex Notation="TeX">$~$</tex></formula>MHz frequency offset with quadrature error less than 1<formula formulatype="inline"><tex Notation="TeX">$^{circ}$</tex></formula>. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419194]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>510</startPage>
			<endPage>523</endPage>
			<fileSize>1595</fileSize>
			<authors><![CDATA[Cheng, K.-W.;Natarajan, K.;Allstot, D. J.;]]></authors>
		</item>
		<item>
			<title><![CDATA[5&#x2013;10 Gb/s 70 mW Burst Mode AC Coupled Receiver in 90-nm CMOS]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419186]]></link>
			<description><![CDATA[<para> A low power burst mode receiver architecture is presented which can be used for AC coupled links where low frequency signal components are attenuated by the channel. The nonlinear path comprises a hysteresis latch that recovers the missing low frequency content and a linear path that boosts the high frequency component by taking advantage of the high pass channel response. By optimally combining them, the front-end recovers NRZ signals up to 13 Gb/s burning only 26 mW in 90 nm CMOS. A low power- and area-efficient clock recovery scheme uses the linear path to injection lock an oscillator. A simple theory and simulation technique for ILO-based receivers is discussed. The clock recovery technique is verified with experimental results at 5&#x2013;10 Gb/s in 90 nm CMOS consuming 70 mW and acquiring lock within 1.5 ns. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419186]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>524</startPage>
			<endPage>537</endPage>
			<fileSize>3049</fileSize>
			<authors><![CDATA[Hossain, M.;Chan Carusone, A.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A 0.6-V Zero-IF/Low-IF Receiver With Integrated Fractional-N Synthesizer for 2.4-GHz ISM-Band Applications]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419185]]></link>
			<description><![CDATA[<para> Supply voltage reduction with process scaling has made the design of analog, RF and mixed mode circuits increasingly difficult. In this paper, we present the design of an ultra-low voltage, low power and highly integrated dual-mode receiver for 2.4-GHz ISM-band applications. The receiver operates reliably from 0.55&#x2013;0.65 V and is compatible with commercial standards such as Bluetooth and ZigBee. We discuss the design challenges at low voltage supplies such as limited f<formula formulatype="inline"><tex Notation="TeX">$_{rm T}$</tex></formula> for transistors and higher nonlinearities due to limited available signal swing, and present the architectural and circuit level design techniques used to overcome these challenges. The highly integrated receiver prototype chip contains RF front-end circuits, analog baseband circuits and the RF frequency synthesizer and was fabricated in a standard digital 90-nm CMOS process; it achieves a gain of 67 dB, noise figure of 16 dB, <formula formulatype="inline"><tex Notation="TeX">${hbox{IIP}}_{3}$</tex></formula> of <formula formulatype="inline"><tex Notation="TeX">$-$</tex></formula>10.5 dBm, synthesizer phase noise of <formula formulatype="inline"><tex Notation="TeX">$-$</tex> </formula>127 dBc/Hz at 3-MHz offset, consumes 32.5 mW from 0.6 V and occupies an active area of 1.7 <formula formulatype="inline"><tex Notation="TeX">${hbox {mm}}^{2}$</tex></formula>. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419185]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>538</startPage>
			<endPage>553</endPage>
			<fileSize>1400</fileSize>
			<authors><![CDATA[Balankutty, A.;Yu, S.-Y.;Feng, Y.;Kinget, P. R.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A 58&#x2013;65 GHz Neutralized CMOS Power Amplifier With PAE Above 10% at 1-V Supply]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419181]]></link>
			<description><![CDATA[<para> A 60-GHz band, three-stage pseudo-differential power amplifier (PA) is implemented with input and output baluns on-chip. Each stage consists of a neutralized common-source amplifier pair. Neutralization mitigates the intrinsic gate-drain feedback of each transistor for increased power gain and reverse isolation. Shielded transformers couple the gain stages and allow low supply voltage operation. Fabricated in a 65-nm bulk CMOS process, the measured small-signal gain of the 0.13<formula formulatype="inline"><tex Notation="TeX">$,times,$</tex> </formula>0.41 mm<formula formulatype="inline"><tex Notation="TeX">$^{2}$</tex> </formula> PA is 16 dB at 60 GHz with 3-dB bandwidth more than 8.5 GHz, while consuming 50 mW from a 1-V supply. Reverse isolation is better than 42 dB from 55 to 65<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>GHz. Maximum saturated output power is 11.5 dBm with a peak PAE of 15.2% measured at 62<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>GHz; from 58 to 65<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>GHz, the measured PAE is above 10%. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419181]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>554</startPage>
			<endPage>564</endPage>
			<fileSize>1522</fileSize>
			<authors><![CDATA[Chan, W. L.;Long, J. R.;]]></authors>
		</item>
		<item>
			<title><![CDATA[High PSR Low Drop-Out Regulator With Feed-Forward Ripple Cancellation Technique]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419190]]></link>
			<description><![CDATA[<para> A low drop-out (LDO) regulator with a feed-forward ripple cancellation (FFRC) technique is proposed in this paper. The FFRC-LDO achieves a high power-supply rejection (PSR) over a wide frequency range. Complete analysis and design steps of the FFRC-LDO are presented in this paper. Kelvin connection is also used to increase the gain&#x2013;bandwidth of the LDO allowing for faster transient performance. The LDO is implemented in 0.13<formula formulatype="inline"> <tex Notation="TeX">$ mu{hbox {m}}$</tex></formula> CMOS technology and achieves a PSR better than <formula formulatype="inline"><tex Notation="TeX">$-$</tex> </formula>56<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>dB up to 10 MHz for load currents up to 25 mA. Load regulation of 1.2<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>mV for a 25 mA step is measured, and the whole LDO consumes a quiescent current of 50 <formula formulatype="inline"><tex Notation="TeX">$mu{hbox{A}}$</tex></formula> with a bandgap reference circuit included. To our knowledge, this is the first LDO that achieves such a high PSR up to 10 MHz. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419190]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>565</startPage>
			<endPage>577</endPage>
			<fileSize>1667</fileSize>
			<authors><![CDATA[El-Nozahi, M.;Amer, A.;Torres, J.;Entesari, K.;Sanchez-Sinencio, E.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A 7.1 mW, 10 GHz All Digital Frequency Synthesizer With Dynamically Reconfigured Digital Loop Filter in 90 nm CMOS Technology]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419178]]></link>
			<description><![CDATA[<para> A 10 GHz all digital frequency synthesizer (ADPLL) with dynamic digital loop filter is presented. Governed by a proposed locking process monitor (LPM), the digital loop filter is automatically reconfigured during the frequency acquisition and phase tracking process. The loop bandwidth is also self-adjusted during the locking process so as to achieve fast lock and low noise simultaneously. A skew-compensated phase accumulator is proposed for high speed operation, which preserves the advantages of low power dissipation while eliminating the accumulated timing skew issue. With less than 7 <formula formulatype="inline"> <tex Notation="TeX">$mu$</tex></formula>s locking time, the measured rms jitter from a 9.92 GHz carrier is about 0.9 ps. The ADPLL core consumes 7.1<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>mW from a 1 V supply, and the digital I/O cells drains 2.7 mW from a 3.3 V supply for chip measurement. Implemented in a 90<formula formulatype="inline"><tex Notation="TeX">$~$</tex> </formula>nm CMOS technology, the core area is only 0.352 mm<formula formulatype="inline"> <tex Notation="TeX">$^{2}$</tex></formula>. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419178]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>578</startPage>
			<endPage>586</endPage>
			<fileSize>1974</fileSize>
			<authors><![CDATA[Yang, S.-Y.;Chen, W.-Z.;Lu, T.-Y.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A Low-Power Continuously-Calibrated Clock Recovery Circuit for UHF RFID EPC Class-1 Generation-2 Transponders]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419188]]></link>
			<description><![CDATA[<para> A low-power, reliable and re-configurable clock recovery circuit for UHF RFID transponders for the EPC Class-1 Generation-2 standard is proposed. Based on a digital frequency-locked loop, the clock recovery circuit uses timing information available in the downlink data, namely, the pulse intervals of the PIE-coded data, to calibrate an oscillator's output frequency to meet the stringent frequency accuracy requirement of the standard. Fabricated in a 0.18-<formula formulatype="inline"><tex Notation="TeX">$mu{hbox {m}}$</tex> </formula> standard CMOS technology, the clock recovery circuit provides a calibrated frequency of 2.56 MHz with a frequency deviation within the range from <formula formulatype="inline"><tex Notation="TeX">$-$</tex></formula>3.2% to <formula formulatype="inline"><tex Notation="TeX">$+ $</tex></formula>1.2% over process, supply voltage and temperature variations. The chip has an active area of 0.22<formula formulatype="inline"><tex Notation="TeX">$~mu{hbox {m}}^{2}$</tex></formula>, operates from a supply voltage from 0.75 V to 1.3 V, and consumes less than 2<formula formulatype="inline"><tex Notation="TeX">$~mu{hbox {W}}$</tex></formula> for a 1-V supply. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419188]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>587</startPage>
			<endPage>599</endPage>
			<fileSize>1674</fileSize>
			<authors><![CDATA[Chan, C.-F.;Pun, K.-P.;Leung, K.-N.;Guo, J.;Leung, L.-K. L.;Choy, C.-S.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A Time-Domain SAR Smart Temperature Sensor With Curvature Compensation and a 3&#x03C3; Inaccuracy of &#x2212;0.4&#x00B0;C &#x223C; +0.6&#x00B0;C Over a 0&#x00B0;C to 90&#x00B0;C Range]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419184]]></link>
			<description><![CDATA[<para> This paper describes a time-domain temperature sensor based on a successive approximation algorithm. Without using any bipolar transistor, a temperature sensor composed of a temperature-dependent delay line (TDDL) is utilized to generate a delay proportional to the measured temperature. A binary-weighted adjustable reference delay line (ARDL) is adopted with an effective delay varied by a SAR control logic to approximate the TDDL delay for output coding. For linearity enhancement, a curvature compensation between both delay lines is invented to achieve the best ever accuracy among inverter-delay-based smart temperature sensors. With two-point calibration, a <formula formulatype="inline"> <tex Notation="TeX">$-$</tex></formula>0.4<formula formulatype="inline"><tex Notation="TeX">$,^{circ}{hbox{C}}$</tex></formula><formula formulatype="inline"><tex Notation="TeX">$,,sim,$</tex> </formula><formula formulatype="inline"><tex Notation="TeX">$+$</tex></formula>0.6<formula formulatype="inline"><tex Notation="TeX">$,^{circ}{hbox{C}}$</tex></formula> inaccuracy (3<formula formulatype="inline"><tex Notation="TeX">$sigma$</tex></formula>) over a 0<formula formulatype="inline"><tex Notation="TeX">$,^{circ}{hbox{C}}sim! {hbox {90}},^{circ}{hbox{C}}$</tex></formula> temperature operation range has been measured for 23 test chips. With 10 output bits, the proposed sensor achieves a resolution better than 0.1<formula formulatype="inline"><tex Notation="TeX">$,^{circ}{hbox{C}}$</tex> </formula> and a chip area of 0.6 <formula formulatype="inline"><tex Notation="TeX">${hbox {mm}}^{2}$</tex></formula> in a TSMC 0.35-<formula formulatype="inline"><tex Notation="TeX">$mu{hbox {m}}$</tex></formula> standard digital CMOS process. The sensor's average current consumption is 11.1 <formula formulatype="inline"> <tex Notation="TeX">$mu{hbox{A}}$</tex></formula> at a conversion rate of 2<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>samp-
les/s. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419184]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>600</startPage>
			<endPage>609</endPage>
			<fileSize>1476</fileSize>
			<authors><![CDATA[Chen, P.;Chen, C.-C.;Peng, Y.-H.;Wang, K.-M.;Wang, Y.-S.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A 0.02-mm<formula formulatype="inline"> <img src="/images/tex/732.gif" alt="^{2}">  </formula> 9-Bit 50-MS/s Cyclic ADC in 90-nm Digital CMOS Technology]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419180]]></link>
			<description><![CDATA[<para> A 9-bit cyclic ADC employs a track-and-evaluation technique for enhancing the speed of residue evaluation. The proposed multiply-by-two circuit has a shorter evaluation time than the conventional design due to the application of a partial positive feedback topology. The residue evaluation and sampling phases are merged to reduce the conversion latency. Hence, only four clock cycles are required to perform the 9-bit conversion. The proposed 0.02-<formula formulatype="inline"><tex Notation="TeX">${hbox {mm}}^{2}$</tex></formula> ADC has been fabricated in 90-nm digital CMOS technology. It operates at 50 MS/s and achieves an SNDR of 50.5 dB with a power consumption of 6.9 mW from a 1.0-V supply. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419180]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>610</startPage>
			<endPage>619</endPage>
			<fileSize>850</fileSize>
			<authors><![CDATA[Huang, Y.-C.;Lee, T.-C.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A 12 bit 50 MS/s CMOS Nyquist A/D Converter With a Fully Differential Class-AB Switched Op-Amp]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419191]]></link>
			<description><![CDATA[<para> A 12 bit 50 MS/s 1.8 V pipelined CMOS analog-to-digital converter (ADC) based on a fully differential class-AB switched operational amplifier achieves low power consumption with a differential input voltage of 2.4 Vp-p. A global-loop dynamic common-mode feedback circuit enables fully differential class-AB operation with dynamic current switching for power reduction. The prototype ADC shows a peak signal-to-noise-and-distortion ratio of 64.0 dB and a peak spurious-free dynamic range of 76.6 dB for a 31 MHz input signal at 50 MS/s while the measured differential and integral nonlinearities are within <formula formulatype="inline"> <tex Notation="TeX">$pm $</tex></formula>0.26 LSB and <formula formulatype="inline"> <tex Notation="TeX">$pm $</tex></formula>0.72 LSB, respectively. The prototype ADC in a 0.18 <formula formulatype="inline"><tex Notation="TeX">$mu{hbox {m}}$</tex></formula> 1P6M CMOS process consumes 18.4 mW at 50 MS/s and 1.8 V occupying an active die area of 0.26 <formula formulatype="inline"><tex Notation="TeX">${hbox {mm}}^{2}$</tex></formula>. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419191]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>620</startPage>
			<endPage>628</endPage>
			<fileSize>2270</fileSize>
			<authors><![CDATA[Kim, Y.-J.;Choi, H.-C.;Ahn, G.-C.;Lee, S.-H.;]]></authors>
		</item>
		<item>
			<title><![CDATA[An 80 mW 40 Gb/s 7-Tap <emphasis emphasistype="italic">T</emphasis>/2-Spaced Feed-Forward Equalizer in 65 nm CMOS]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419189]]></link>
			<description><![CDATA[<para> A 7-tap 40 Gb/s FFE using a 65 nm standard CMOS process is described. A number of broadbanding and calibration techniques are used, which allow high-speed operation while consuming 80 mW from a 1 V supply. ESD protection is added to 40 Gb/s IOs and an inexpensive plastic package is used to make the chip closer to a commercial product. The measured tap delay frequency response variation is less than 1 dB up to 20 GHz and tap-to-tap delay variation is less than 0.3 ps. More than 50% vertical and 70% horizontal eye opening from a closed input eye are observed. The use of a CMOS process enables further integration of this core into a DFE equalizer or a CDR/Demux based receiver. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419189]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>629</startPage>
			<endPage>639</endPage>
			<fileSize>1038</fileSize>
			<authors><![CDATA[Momtaz, A.;Green, M. M.;]]></authors>
		</item>
		<item>
			<title><![CDATA[All-Digital Circuits for Measurement of Spatial Variation in Digital Circuits]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419187]]></link>
			<description><![CDATA[<para> Increased variation in CMOS processes due to scaling results in greater reliance on accurate variation models in developing circuit methods to mitigate variation. This paper investigates spatial variation in digital circuit performance: we describe a test-chip in 90 nm CMOS containing all-digital measurement circuits capable of extracting accurate variation data. Specifically, we use replicated 64-bit Kogge&#x2013;Stone adders, ring oscillators (ROs) of varying gate type and stage length and an all-digital, sub-picosecond resolution delay measurement circuit to provide this data. Measurement data from the test-chips indicate that 1)<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>relative variation is significantly larger in low-voltage domains, 2)<formula formulatype="inline"> <tex Notation="TeX">$~$</tex></formula>within-die variation is spatially uncorrelated, and 3)<formula formulatype="inline"><tex Notation="TeX">$~$</tex></formula>die-to-die (or global) variation is strongly correlated, but degrades toward uncorrelated as the power-supply voltage is lowered. Lastly, extended analysis of the data reveals that systematic effects such as layout pattern dependencies or circuit structure can be misinterpreted as random but spatially-correlated variation. This suggests that circuit designers will reap more benefit from design tools capable of modeling systematic, position-dependent variation rather than spatially correlated, distance-dependent variation. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419187]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>640</startPage>
			<endPage>651</endPage>
			<fileSize>1766</fileSize>
			<authors><![CDATA[Drego, N.;Chandrakasan, A.;Boning, D.;]]></authors>
		</item>
		<item>
			<title><![CDATA[A 116 fps/74 mW Heterogeneous 3D-Media Processor for 3-D Display Applications]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419183]]></link>
			<description><![CDATA[<para> In this paper, a heterogeneous 3D-media processor is presented, which supports all 3-D display applications by combining a 3-D display IP with a 3-D graphics IP and a stereo video decoder. For mobile environments, adaptive power management scheme is proposed, which saves power consumption up to 186 mW by turning off idle functional blocks based on a target application, a target performance, and the run-time ratio between different IPs. As a result, the minimum power consumption of the processor is only 15 mW, while the overall power consumption is 201 mW. As well as the reduction of power consumption, this work shows impressive performance improvement. The proposed fast modulo operators and adopted division-free algorithm reduces the critical latencies of 3-D display image processing. The proposed fast datapath with parallel architecture increase synthesis rate up to 116 fps which is 17 times faster than a previous work. In addition, reordered operation sequence fixes memory bandwidth regardless of the number of images to be produced. In the 3-D graphics IP and the decoding IP, redundant datapath are merged using an IEEE 754 compliant floating-point vector unit to save both chip area and power consumption, which even reduces the critical latency by 30%. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419183]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>652</startPage>
			<endPage>667</endPage>
			<fileSize>4940</fileSize>
			<authors><![CDATA[Kim, S.-H.;Kim, H.-Y.;Kim, Y.-J.;Chung, K.;Kim, D.;Kim, L.-S.;]]></authors>
		</item>
		<item>
			<title><![CDATA[An Ultra-Low-Energy Multi-Standard JPEG Co-Processor in 65 nm CMOS With Sub/Near Threshold Supply Voltage]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419176]]></link>
			<description><![CDATA[<para> We present a design technique for (near) subthreshold operation that achieves ultra low energy dissipation at throughputs of up to 100 MB/s suitable for digital consumer electronic applications. Our approach employs i) architecture-level parallelism to compensate throughput degradation, ii) a configurable <formula formulatype="inline"> <tex Notation="TeX">$V_{rm T}$</tex></formula> balancer to mitigate the <formula formulatype="inline"><tex Notation="TeX">$V_{rm T}$</tex></formula> mismatch of nMOS and pMOS transistors operating in sub/near threshold, and iii) a fingered-structured parallel transistor that exploits <formula formulatype="inline"><tex Notation="TeX">$V_{rm T}$</tex></formula> mismatch to improve current drivability. Additionally, we describe the selection procedure of the standard cells and how they were modified for higher reliability in the subthreshold regime. All these concepts are demonstrated using <emphasis emphasistype="italic">SubJPEG</emphasis>, a <formula formulatype="inline"><tex Notation="TeX">$1.4times 1.4~{hbox {mm}}^{2}$</tex></formula> 65 nm CMOS standard-<formula formulatype="inline"> <tex Notation="TeX">$V_{rm T}$</tex></formula> multi-standard JPEG co-processor. Measurement results of the discrete cosine transform (DCT) and quantization processing engines, operating in the subthreshold regime, show an energy dissipation of only 0.75 pJ per cycle with a supply voltage of 0.4 V at 2.5 MHz. This leads to <formula formulatype="inline"><tex Notation="TeX">$8.3times$</tex> </formula> energy reduction when compared to using a 1.2 V nominal supply. In the near-threshold regime the energy dissipation is 1.0 pJ per cycle with a 0.45 V supply voltage at 4.5 MHz. The system throughput can meet 15 fps 640<formula formulatype="inline"><tex Notation="TeX">$,times,$</tex></formula>480 pixel VGA standard. Our methodology is largely applicable to designing other sound/graphic and streaming processors. </para>]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419176]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>668</startPage>
			<endPage>680</endPage>
			<fileSize>3340</fileSize>
			<authors><![CDATA[Pu, Y.;Pineda de Gyvez, J.;Corporaal, H.;Ha, Y.;]]></authors>
		</item>
		<item>
			<title><![CDATA[Patent Abstracts]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419182]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419182]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>681</startPage>
			<endPage>691</endPage>
			<fileSize>518</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[2010 Bipolar/BiCMOS Circuits and Technology Meeting]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419177]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419177]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>692</startPage>
			<endPage>692</endPage>
			<fileSize>803</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[IEEE Journal of Solid-State Circuits information for authors]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419172]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419172]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>C3</startPage>
			<endPage>C3</endPage>
			<fileSize>32</fileSize>
			<authors><![CDATA[]]></authors>
		</item>
		<item>
			<title><![CDATA[Blank page]]></title>
			<link><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419173]]></link>
			<description><![CDATA[ ]]></description>
			<pubDate><![CDATA[March  2010]]></pubDate>
			<guid><![CDATA[http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5419169&arnumber=5419173]]></guid>
			<volume>45</volume>
			<issue>3</issue>
			<startPage>C4</startPage>
			<endPage>C4</endPage>
			<fileSize>5</fileSize>
			<authors><![CDATA[]]></authors>
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