Home  |   Login  |   Logout  |   Access Information  |   Alerts  |   Purchase History  |   Cart  |   Sitemap  |   Help   
 
Login
BROWSE SEARCH IEEE XPLORE GUIDE SUPPORT
Article Information

Schur stability radius bounds for robust iterative learning controller design
Hyo-Sung Ahn; Moore, K.L.; YangQuan Chen
American Control Conference, 2005. Proceedings of the 2005
Volume , Issue , 8-10 June 2005 Page(s): 178 - 183 vol. 1
Digital Object Identifier   10.1109/ACC.2005.1469928
Summary: This paper computes bounds on the Schur stability radius for use in designing robust iterative learning controllers. The discrete Lyapunov equation is used to compute the Schur stability radius of the ILC system for the case of parametric or interval perturbations in the system Markov parameters. This paper is distinct from the existing ILC works in that the interval robustness concepts are integrated with asymptotic stability and monotonic convergence conditions to suggest design of the learning gain matrix that makes the system robust against interval model uncertainties up to a computable bound. After derivations of the analytical stability radius, optimization schemes are suggested to design the learning gain matrix. The proposed approach allows design of causal/noncausal time-varying learning matrix gains.

» View citation and abstract

IEEE Members

Log in by entering your IEEE Web Account Username and Password.

IEEE Communications Society members: If you subscribe to the IEEE Electronic Periodicals Package or IEEE Electronic Periodicals Package Plus, you must access your subscription at www.comsoc.org.

Users at Subscribing Institutions

Check with your librarian, information professional, or system manager to determine if you need to log in. Please complete the online Technical Support Form if you need assistance.

Already Purchased This Article?

Select the Purchase History link to access the document. You will have 5 Days after purchase to access the Full Text PDF. Please complete the online Technical Support Form if you need assistance.

Guests

• Search and access Abstract records free of charge
Register for table of contents alerts
• Purchase Full Text PDF documents

» Learn more about subscription options or how to become an IEEE Member.

You are not logged in.
LOGIN
Username
Password
GO
» Forgot your password?
Please remember to log out when you have finished your session.
You must log in to access:
• Advanced or Author Search
• CrossRef Search
• AbstractPlus Records
• Full Text PDF
• Full Text HTML
Access this document
» Buy this document now
» Learn more about
» Learn more about
   purchasing articles
   and standards
Learn more about IEEE Subscriptions
Indexed by IEE Inspec
© Copyright 2009 IEEE – All Rights Reserved