Trends in testing integrated circuits
Vermeulen, B.; Hora, C.; Kruseman, B.; Marinissen, E.J.; van Rijsinge, R.
Test Conference, 2004. Proceedings. ITC 2004. International
Volume , Issue , 26-28 Oct. 2004 Page(s): 688 - 697
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Summary: New process technologies, increased design complexity, and more stringent customer quality requirements drive the need for better test quality, improved test program development, and faster ramp-up at overall lower product cost. In this paper we describe the main industry test trends and recent innovations in testing integrated circuits as they are applied within Philips.

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