On using IEEE P1500 SECT for test plug-n-play
Marinissen, E.J.; Kapur, R.; Zorian, Y.
Test Conference, 2000. Proceedings. International
Volume , Issue , 2000 Page(s):770 - 777
Digital Object Identifier   10.1109/TEST.2000.894273
Summary:System chips are increasingly designed by embedding reusable cores. A core-based test strategy for such ICs is often attractive and sometimes even mandatory. IEEE P1500 SECT is a standard under development that standardizes a core test language and a core wrapper, in order to facilitate plug-n-play core testing. In this paper, we describe how one standard supports both easy integration and interoperability as well as flexibility and scalability. Possible usage scenarios of the standard for core providers, core users, and EDA tool developers are sketched

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