Towards a standard for embedded core test: an example
Marinissen, E.J.; Zorian, Y.; Kapur, R.; Taylor, T.; Whetsel, L.
Test Conference, 1999. Proceedings. International
Volume , Issue , 1999 Page(s):616 - 627
Digital Object Identifier   10.1109/TEST.1999.805786
Summary:Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability with respect to the test of such core-based ICs, especially if they contain cores from different sources. This paper briefly describes IEEE P1500, and illustrates through a simplified example its dual compliance concept, its Scalable Hardware Architecture, and its Core Test Language. This paper provides a preliminary, unapproved view on IEEE P1500. The standard is still under development, and this paper only reflects the view of five active participants of the Standardization Committee on its current status

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